一种基于ROM模型的测试性指标论证方法

针对实践中缺乏理论性、可实施性强的测试性指标论证方法的现状，提出了一种基于可靠度、战备完好率与可维修度（ROM）模型的测试性指标论证方法。从战备完好率（O）、可靠度（R）、可维修度（M）关系式入手，将关系式中的可靠度和可维修度分别用平均故障间隔时间（MTBF）和平均修复时间（MTTR）替换，再建立MTBF和MTTR与故障诊断率、虚警率和机内测试（BIT）故障率的关系式并代入"ROM"关系式，得到战备完好率与测试性指标之间的关系式，建立待解指标与BIT数量之间的关系式，通过代入和消减参数得到战备完好率随BIT数量变化曲线，通过找到曲线极值点得到最佳BIT数量，进而得到最佳的测试性指标。在模型构建和指标求解过程中进行了较为充分的仿真分析，得到了大量与经验相符的规律性结论，为不同对象应用该方法进行参数设置时提供了较为充分的参考。最后应用本文方法对某光电一体化设备进行了指标论证，演示并验证了本文方法的有效性。

Testability index determination method based on ROM model

Aiming at the lack of theoretical and practical testability index demonstration method in practice, a novel method based on the ROM(operational readiness, reliability and maintainability) model is proposed. Starting from the relational expression of operational readiness (O), reliability (R) and maintainability (M), we establish the relations among Mean Time Between Failure (MTBF), Mean Time to Repair (MTTR) and fault diagnosis rate, false alarm rate and Built in Test (BIT) failure rate and substitute them into the "ROM" formula, obtaining the relation between the operational readiness and testability parameters. The relations between testability parameters and the number of BITs (number of BITs) are further established and substituted into the "ROM" formula to achieve the relation between operational readiness and number of BITs. The optimal number of BITs can be obtained from the curve of operational readiness and number of BITs, and the best testability index is derived subsequently. Considerable conclusions have been drawn from the simulation analysis of the availability curves, providing sufficient reference for different applications in setting parameters. Finally, photoelectric integrated equipment is used as a case to demonstrate the effectiveness of the ROM model and method.