Effects of Atomic Oxygen Irradiation on Transparent Conductive Oxide Thin Films

作为一种功能薄膜,透明导电氧化物(TCO)薄膜在飞行器的抗原子氧(AO)涂层和太阳能电池领域有着巨大的应用价值。ZnO:Al(ZAO)和In2O3:Sn(ITO)薄膜是目前研究和应用最广泛的TCO。本文对ITO薄膜和ZAO薄膜进行了不同通量的AO辐照。通过对辐照前后样品的X射线衍射、扫描电镜及霍耳效应的表征及测试,研究了AO辐照对这两种TCO薄膜的结构、性能及电学特性的影响。研究表明AO辐照对ZAO薄膜表面有明显的侵蚀作用,但对其结构和导电性能没有明显影响。对于ITO薄膜,随着AO通量的增大,其载流子浓度逐渐下降从而导致了电阻率的提高,电阻率的最大变化达到了21.7%。

Effects of Atomic Oxygen Irradiation on Transparent Conductive Oxide Thin Films

Transparent conductive oxide (TCO) thin film is a kind of functional material which has potential applications in solar cells and atomic oxygen (AO) resisting systems in spacecrafts. Of TCO, ZnO:Al (ZAO) and In2O3:Sn (ITO) thin films have been widely used and investigated. In this study, ZAO and ITO thin films were irradiated by AO with different amounts of fluence. The as-deposited samples and irradiated ones were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and Hall-effect measurement to investigate the dependence of the structure, morphology and electrical properties of ZAO or ITO on the amount of fluence of AO irradiation. It is noticed that AO has erosion effects on the surface of ZAO without evident influences upon its structure and conductive at most 21.7%.