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A Fault Sample Simulation Approach for Virtual Testability Demonstration Test
Authors:ZHANG Yong  QIU Jing  LIU Guanjun  YANG Peng
Institution:ZHANG Yong,QIU Jing *,LIU Guanjun,YANG Peng Laboratory of Science and Technology on Integrated Logistics Support,College of Mechatronics Engineering and Automation,National University of Defense Technology,Changsha 410073,China
Abstract:Virtual testability demonstration test has many advantages,such as low cost,high efficiency,low risk and few restrictions.It brings new requirements to the fault sample generation.A fault sample simulation approach for virtual testability demonstration test based on stochastic process theory is proposed.First,the similarities and differences of fault sample generation between physical testability demonstration test and virtual testability demonstration test are discussed.Second,it is pointed out that the fault occurrence process subject to perfect repair is renewal process.Third,the interarrival time distribution function of the next fault event is given.Steps and flowcharts of fault sample generation are introduced.The number of faults and their occurrence time are obtained by statistical simulation.Finally,experiments are carried out on a stable tracking platform.Because a variety of types of life distributions and maintenance modes are considered and some assumptions are removed,the sample size and structure of fault sample simulation results are more similar to the actual results and more reasonable.The proposed method can effectively guide the fault injection in virtual testability demonstration test.
Keywords:fault sample  testability demonstration  virtual testability test  stochastic process  statistical simulation  Monte Carlo  maintenance
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