| 高密度栅测应变 |
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| 引用本文： | 石玲,戴福隆.高密度栅测应变[J].航空计测技术,1995,15(6):12-13,25. |
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| 作者姓名： | 石玲 戴福隆 |
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| 作者单位： | 清华大学工程力学系!北京市，100084，清华大学工程力学系!北京市，100084 |
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| 摘 要： | 将高密度光栅应用于力学参量的测量中。通过测得试件变形前后正交光栅衍射点阵的偏移移量，可逐点得到试件因载荷作用而引起的面内应变、离面位移和刚体传动分量。
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| 关 键 词： | 高密度栅 应变 衍射场 图象传感器 |
Strain Measurement by High Frequency Grating Method |
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| Shi Ling,Dai Fulong.Strain Measurement by High Frequency Grating Method[J].Aviation Metrology & Measurement Technology,1995,15(6):12-13,25. |
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| Authors: | Shi Ling Dai Fulong |
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| Institution: | Shi Ling;Dai Fulong |
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| Abstract: | The high frequency grating is applied into the measurement of mechanical parameters.The point by point in plane strains,out of plane displacement and rigid body rotations can be obtained by measuring the displacements of diffraction fields of the specimen grating before and after loating.Using CCD as the image sensor,the above deformation values can be input into the computer via I/O board and data processing can be made automatically. |
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| Keywords: | High frequency grating Strain Diffration field Image sensor |
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