| KWD—502型可控硅稳压电源故障分析与测试 |
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| 引用本文： | 肖润陆.KWD—502型可控硅稳压电源故障分析与测试[J].航空计测技术,1999,19(3):20-25. |
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| 作者姓名： | 肖润陆 |
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| 作者单位： | ：肖润陆 |
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| 摘 要： | 结合电路工作原理，重点介绍了ＫＷＤ－５０２型可挂硅直流稳压电源四种故障类型的分析处理及其测试方法，以便确保它在测量过程中的使用可靠性。
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| 关 键 词： | 故障分析 测试 可靠性 可控硅 稳压电源 |
| 修稿时间： | 1998-02-23 |
Malfunction Analysis and Test of Type KWD-502 Silicon Controlled DC Voltage-stabilized Source |
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| Xiao Runlu.Malfunction Analysis and Test of Type KWD-502 Silicon Controlled DC Voltage-stabilized Source[J].Aviation Metrology & Measurement Technology,1999,19(3):20-25. |
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| Authors: | Xiao Runlu |
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| Abstract: | Associating the circuit operation principle,the methods of an analysis and test of thefour malfunction patterns of type KWD- 502 silicon controlled DC voltage-stabilized source are mainlyintroduced in order to truly ensure its serviceability during measuring process. |
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| Keywords: | Malfunction analysis Test Reliability |
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