| 军用电子产品的高加速寿命试验 |
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| 引用本文： | 翁雷,刘庆民,张树文.军用电子产品的高加速寿命试验[J].航空精密制造技术,2009,45(1). |
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| 作者姓名： | 翁雷 刘庆民 张树文 |
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| 作者单位： | 江南计算技术研究所,无锡,214083 |
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| 摘 要： | 以军用电子产品的高加速寿命试验(HALT)为研究对象,分析了传统可靠性环境模拟试验的弊端,介绍了HALT试验的特性、目的、优点及发展现状,通过实际的HALT试验阐述了试验剖面设计及被试验产品工作极限的确定方法,并给出试验结论,为同类产品的可靠性设计提供了依据.
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| 关 键 词： | 军用电子产品 高加速寿命试验 可靠性 试验剖面图 工作极限 |
Highly Accelerated Life Test of Military Electronic Product |
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| WENG Lei,LIU Qing-min,ZHANG Shu-wen.Highly Accelerated Life Test of Military Electronic Product[J].Aviation Precision Manufacturing Technology,2009,45(1). |
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| Authors: | WENG Lei LIU Qing-min ZHANG Shu-wen |
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| Institution: | Jiangnan Institute of Computing Technology;Wuxi 214083 |
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| Abstract: | Highly accelerated life test (HALT) of military electronic product is researched, the abuses of reliability environment test are analyzed. The characteristics, purposes, advantages and development actuality are introduced. The test profiles are designed and the methods are provided to search the operating limits through actual HALT. The operating limits are confirmed, and the rule is provided for the reliability design of analogical products. |
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| Keywords: | military electronic product highly accelerated life test reliability profile operating limit |
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