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二维 C/SiC复合材料的室温疲劳行为及寿命预测
引用本文:吕美平,童小燕,任少华,姚磊江.二维 C/SiC复合材料的室温疲劳行为及寿命预测[J].航空工程进展,2014,5(1):104-108.
作者姓名:吕美平  童小燕  任少华  姚磊江
作者单位:西北工业大学 航空学院,陕西西安西北工业大学 无人机特种技术重点实验室,西北工业大学航空学院,西北工业大学
基金项目:国家自然科学基金项目(面上项目,重点项目,重大项目)
摘    要:为了研究二维C/SiC复合材料的疲劳行为并对其进行寿命预测,进行室温下二维C/SiC复合材料的拉伸试验和疲劳试验,并使用扫描电镜(SEM)观察其断口形貌。结果表明:C/SiC复合材料表现出类似金属的韧性断裂行为,疲劳极限约为极限拉伸强度(UTS)的85%,在室温下具有较为优良的抗疲劳性能;由于复合材料的缺口钝化效应,缺口试样的S-N曲线要高于光滑试样,但两者趋势一致,据此提出基于名义应力的疲劳寿命预测方法。

关 键 词:疲劳  寿命预测  C  SiC  复合材料  扫描电镜
收稿时间:2013/3/18 0:00:00
修稿时间:4/1/2013 12:00:00 AM

Fatigue Behavior and Life Prediction of 2D C/SiC under Room Temperature
Lv Meiping,TONG Xiaoyan,Ren shaohua and Yaoleijiang.Fatigue Behavior and Life Prediction of 2D C/SiC under Room Temperature[J].Advances in Aeronautical Science and Engineering,2014,5(1):104-108.
Authors:Lv Meiping  TONG Xiaoyan  Ren shaohua and Yaoleijiang
Institution:Science and Technology on UAV Laboratory,Northwestern Polytechnical University,College of Aeronautics,Northwestern Polytechnical University;Science and Technology on UAV Laboratory,Northwestern Polytechnical University,Science and Technology on UAV Laboratory,Northwestern Polytechnical University,National Key Laboratory of Science and Technology on UAV,Northwestern Polytechnical University
Abstract:Monotonic tension tests and tension-tension fatigue tests combined with microscopic observation by scanning electron microscopy (SEM) were performed to investigate the fatigue behavior and life prediction of 2D C/SiC. The results show that C/SiC exhibits metal-similar ductile fracture behavior. The fatigue limit is about 85% of ultimate tensile strength(UTS), which indicates that C/SiC has excellent fatigue performance under room temperature. The tendency of the S-N curve of the notched specimen is consistent with the curve of the smooth specimen. But the curve of the notched specimen is higher than that of the smooth specimen, due to the notch insensitivity and notch blunted effect of composite materials. According to the test results, a fatigue prediction model based on the nominal stress is presented.
Keywords:fatigue  life prediction  C/SiC  scanning electron microscopy
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