| 片上系统测试数据压缩的优化型FDR编码机制(英文) |
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| 引用本文： | 张颖,吴宁,葛芬.片上系统测试数据压缩的优化型FDR编码机制(英文)[J].南京航空航天大学学报(英文版),2012,29(1):77-83. |
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| 作者姓名： | 张颖 吴宁 葛芬 |
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| 作者单位： | 南京航空航天大学电子信息工程学院,南京,210016,中国 |
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| 基金项目： | 国家自然科学基金，航空科学基金，中国博士后科学基金，江苏省科技支撑计划，南京航空航天大学基本科研业务经费，南京航空航天大学引进人才科研启动基金 |
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| 摘 要： | 测试数据压缩是片上系统(System-on-chip,SoC)测试中的关键问题之一,用于有效地减少测试数据总量。本文提出了一种新颖的变长-变长压缩编码,称为AFDR(Advanced frequency-directed run-length)编码。它同时对0游程和1游程进行编码,并对等长游程赋以相同的编码,优化了仅仅考虑0游程的FDR(Frequency-directed run-length)码。此外,对游程长度为2的数据(即00和11)进行特殊处理,进一步地提高了压缩比。ISCAS89标准电路下的实验结果表明,AFDR编码的压缩效果明显优于FDR编码以及同类型的其他编码。
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| 关 键 词： | 测试数据压缩 FDR编码 测试源划分 片上系统 |
ADVANCED FREQUENCY-DIRECTED RUN-LENTH BASED CODING SCHEME ON TEST DATA COMPRESSION FOR SYSTEM-ON-CHIP |
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| Zhang Ying
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Wu Ning
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Ge Fen.ADVANCED FREQUENCY-DIRECTED RUN-LENTH BASED CODING SCHEME ON TEST DATA COMPRESSION FOR SYSTEM-ON-CHIP[J].Transactions of Nanjing University of Aeronautics & Astronautics,2012,29(1):77-83. |
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| Authors: | Zhang Ying Wu Ning Ge Fen |
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| Institution: | (College of Electronic and Information Engineering,Nanjing University of Aeronautics and Astronautics,Nanjing,210016,P.R.China) |
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| Abstract: | Test data compression and test resource partitioning(TRP)are essential to reduce the amount of test data in system-on-chip testing.A novel variable-to-variable-length compression codes is designed as advanced frequency-directed run-length(AFDR)codes.Different from frequency-directed run-length(FDR)codes,AFDR encodes both 0-and 1-runs and uses the same codes to the equal length runs.It also modifies the codes for 00 and 11 to improve the compression performance.Experimental results for ISCAS 89 benchmark circuits show that AFDR codes achieve higher compression ratio than FDR and other compression codes. |
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| Keywords: | test data compression FDR codes test resource partitioning system-on-chip |
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