| H+辐照前后C-SiC涂层的XPS分析 |
| |
| 引用本文： | 熊器,杨斌,刘耀光,汪德志,黄宁康,雷家荣.H+辐照前后C-SiC涂层的XPS分析[J].南昌航空工业学院学报,2002,16(3):33-37. |
| |
| 作者姓名： | 熊器 杨斌 刘耀光 汪德志 黄宁康 雷家荣 |
| |
| 作者单位： | 南昌航空工业学院教务处(熊器)，四川大学原子核科学技术研究所·教育部辐射物理及技术重点实验室(杨斌，汪德志，黄宁康)，中国工程物理研究院核物理与化学所(刘耀光)，中国工程物理研究(雷家荣) |
| |
| 基金项目： | 获国家自然科学基金 (5 97810 0 2 )，中国工程物理研究院科研基金资助 |
| |
| 摘 要： | 对不锈钢基体上离子束混合沉积的C－SiC涂层进行了H^ 辐照模拟试验，由SIMS测量H^ 辐照前后氢的浓试分布，采用沟电子能谱（XPS）对H^ 辐照前后涂层元素C和Si进行了内层电子结合能的测量分析，研究C及Si的化学键态的变化与H的关系，探讨SiC涂层阻氢机理。
|
| 关 键 词： | 涂层 XPS 沟电子能谱 碳 碳化硅 薄膜 阻氢性能 |
| 文章编号： | 1001-4926(2002)03-0033-05 |
| 修稿时间： | 2002年4月27日 |
XPS analysis for the C-SiC coatings before and after H+ ion irradiation |
| |
| XIONG Qi ,YANG Bin ,LIU Yao guang ,WANG De-zhi ,HUANG Ning kang LEI Jia rong.XPS analysis for the C-SiC coatings before and after H+ ion irradiation[J].Journal of Nanchang Institute of Aeronautical Technology(Natural Science Edition),2002,16(3):33-37. |
| |
| Authors: | XIONG Qi YANG Bin LIU Yao guang WANG De-zhi HUANG Ning kang LEI Jia rong |
| |
| Institution: | XIONG Qi 1,YANG Bin 2,LIU Yao guang 3,WANG De-zhi 2,HUANG Ning kang 2 LEI Jia rong 3 |
| |
| Abstract: | Simulating experiments of H + irradiation were made for the C-SiC coatings deposited by ion beam mixing on stainless steel substrates. Hydrogen depth profiles of SIMS spectra were measured for the specimen before and after H + ion irradiation. XPS was used to analyze the chemical bonding energy for C and Si elements of coatings before and after H + ion irradation. Relationship between the changes of the chemical bond states for the elements of the C-SiC films and hydrogen was studied. Related mechanism of hydrogen resistant property for the C-SiC coatings was discussed. |
| |
| Keywords: | C-SiC coating H + ion irradiation XPS |
| 本文献已被 CNKI 等数据库收录！ |
