| 80C31微处理器单粒子效应敏感性地面试验研究 |
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| 引用本文： | 薛玉雄,曹 洲,杨世宇,田 恺,郭 刚,刘建成.80C31微处理器单粒子效应敏感性地面试验研究[J].航天器环境工程,2008,25(2):110-113. |
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| 作者姓名： | 薛玉雄 曹 洲 杨世宇 田 恺 郭 刚 刘建成 |
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| 作者单位： | 1. 兰州物理研究所,真空低温技术与物理国家重点实验室,兰州,730000
2. 中国原子能科学研究院核物理研究所,北京,102413 |
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| 摘 要： | 文章针对不同厂家的80C31微处理器,利用重离子、锎源模拟源进行单粒子效应地面试验研究。详细介绍了80C31微处理器单粒子效应试验原理、试验方法、试验系统的软硬件组成以及试验取得的结论。通过试验研究获得了80C31微处理器单粒子翻转和单粒子锁定特征参数。研究结果可为被测器件在卫星型号的使用提供技术参考依据。
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| 关 键 词： | 单粒子效应 单粒子翻转 单粒子锁定 80C31微处理器 重离子 锎源 |
| 文章编号： | 1673-1379(2008)02-0110-04 |
| 收稿时间： | 2007/12/5 0:00:00 |
| 修稿时间： | 2007年12月5日 |
Study on single event effects on 80C31 microprocessor |
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| Xue Yuxiong,Cao Zhou,Yang Shiyu,Tian Kai,Guo Gang and Liu Jiancheng.Study on single event effects on 80C31 microprocessor[J].Spacecraft Environment Engineering,2008,25(2):110-113. |
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| Authors: | Xue Yuxiong Cao Zhou Yang Shiyu Tian Kai Guo Gang and Liu Jiancheng |
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| Institution: | National Laboratory of Vacuum & Cryogenics Technology and Physics, Lanzhou Institute of Physics;National Laboratory of Vacuum & Cryogenics Technology and Physics, Lanzhou Institute of Physics;National Laboratory of Vacuum & Cryogenics Technology and Physics, Lanzhou Institute of Physics;National Laboratory of Vacuum & Cryogenics Technology and Physics, Lanzhou Institute of Physics;Institute of Nuclear Physics, China Institute of Atomic Energy;Institute of Nuclear Physics, China Institute of Atomic Energy |
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| Abstract: | This paper investigates single event effects(SEE) of 80C31 microprocessor,using heavy ion accelerator and 252Cf simulation source. The test method,the test system,including both software and hardware,and the experimental results are presented in detail. The single event upset(SEU) and single event latchup(SEL) characteristics of 80C31 microprocessor are identified,which can be useful for selection of such devices in satellites. |
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| Keywords: | single event effects single event upset single event latchup 80C31 microprocessor heavy ion 252Cf source |
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