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国产数字信号处理器在轨验证技术研究
引用本文:任文冠,徐洪信,邵思霈,张洪娟.国产数字信号处理器在轨验证技术研究[J].航天器环境工程,2012,29(5):548-553.
作者姓名:任文冠  徐洪信  邵思霈  张洪娟
作者单位:1.山东航天电子技术研究所,烟台 264003
摘    要:文章通过研究某国产数字信号处理器(XX-DSP)体系结构、DSP地面测试方法和空间环境对DSP的典型影响,设计了一种针对国产DSP类器件的在轨验证方法。验证系统硬件平台采用1∶1热备份设计,提高系统可靠性;验证方法借鉴当前地面应用广泛的功能测试方法,覆盖DSP的全部功能单元;另外考虑空间环境中的电离总剂量效应和单粒子效应影响,对DSP的片内RAM和内部寄存器的单粒子翻转(SEU)进行统计,并最终给出单粒子翻转率,同时检测DSP单粒子锁定(SEL);最后通过运行DSP典型应用算法——有限长单位冲激响应(FIR)滤波算法验证DSP的系统功能,全面考核国产DSP的空间环境适应性。

关 键 词:数字信号处理器  在轨验证  功能测试  总剂量效应  单粒子效应
收稿时间:3/6/2012 12:00:00 AM
修稿时间:2012/9/26 0:00:00

The in-orbit validation by functional test for home-made DSP
Ren Wenguan,Xu Hongxin,Shao Sipei,and Zhang Hongjuan.The in-orbit validation by functional test for home-made DSP[J].Spacecraft Environment Engineering,2012,29(5):548-553.
Authors:Ren Wenguan  Xu Hongxin  Shao Sipei  and Zhang Hongjuan
Institution:1.Shandong Institute of Space Electro-Technology, Yantai 264003, China
Abstract:This paper proposes a validation method for China-made DSP, based on the architecture of XX-DSP, the ground test methods for DSP, and the typical features of the space environment. The hardware platform improves the system reliability by the introduction of the 1 :l hot backup. With due consideration of the ground functional test technique, this method validates all XX-DSP's functional elements. Besides, with the consideration of the impact of the space environments, the total ionizing dose effects and the single event effects, this design records the single event upset (SEU) on the on-chip RAM and registers, and finally calculates the SEU rate. This design also detects the single event latch-up (SEL). At last, by running the typical application program with the FIR filtering algorithm, its systemic functions and the space environmental adaptability are validated.
Keywords:DSP  in-orbit validation  functional test  total dose effects  single event effects
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