结构化平面表面发射率的计算方法及其验证

结构化高发射率辐射表面广泛应用于红外定标、超低温冷源和吸波热沉等，发射率为其核心指标。结构化高发射率表面的设计首先是确定其表面结构单元的尺寸参数，如尖锥的高度、结构角等，然后设置高发射率涂层。为准确获取所设计结构化高发射率表面的发射率，文章依据经典的传热学公式推导给出一种分析计算方法，并采用仿真分析、样件测试等形式验证了该计算方法的有效性。此方法适用于方锥、尖劈和蜂窝等形式高发射率表面的设计计算。

Design and verification of structured high emissivity radiation surface

The structured high emissivity radiation surfaces are widely used in the infrared calibration, the ultra-low temperature cold source and the microwave absorbing heat sink, with the emissivity as the core index. In the design of the structured high emissivity surface, the first thing is to determine the size parameters of the structural surface, such as the height of the sharp cone and the structural angle, and then to set the high emissivity coating. Based on the classical heat transfer formula, this paper proposes a method to analyze and calculate the emissivity of the structured high emissivity surface. Simulation analysis and sample test are conducted to verify the effectiveness of the method, ensuring that this method can be used for design of the high emissivity surface in the form of cone, wedge or honeycomb.