| MOSFET单粒子烧毁引起的DC/DC电源变换器功能失效试验研究 |
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| 引用本文： | 李鹏伟,罗磊,王文炎,于庆奎,唐民,刘杰.MOSFET单粒子烧毁引起的DC/DC电源变换器功能失效试验研究[J].航天器环境工程,2013,30(5):512-515. |
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| 作者姓名： | 李鹏伟 罗磊 王文炎 于庆奎 唐民 刘杰 |
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| 作者单位： | 1. 中国空间技术研究院 宇航物资保障事业部,北京,100029
2. 中国科学院 兰州近代物理研究所,兰州,730000 |
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| 摘 要： | 文章利用回旋加速器产生的Kr离子，对双路输出的DC／DC电源变换器开展了单粒子效应试验研究，分析了在空载和加载两种偏置条件下的试验结果，指出内部功率MOSFETs器件的漏一源端电压在单粒子辐照条件下超出了器件的击穿电压是导致DC／DC电源变换器单粒子功能失效的直接原因，最后给出了航天器电源系统抗辐射设计和功率MOSFETs器件选用建议。
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| 关 键 词： | DC DC电源变换器 单粒子效应 场效应晶体管 单粒子烧毁 地面试验 |
Test study of function failure of DC/DC converter caused by single event burnout of power MOSFETs |
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| Li Pengwei,Luo Lei,Wang Wenyan,Yu Qingkui,Tang Min and Liu Jie.Test study of function failure of DC/DC converter caused by single event burnout of power MOSFETs[J].Spacecraft Environment Engineering,2013,30(5):512-515. |
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| Authors: | Li Pengwei Luo Lei Wang Wenyan Yu Qingkui Tang Min and Liu Jie |
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| Institution: | 1. China Aerospace Components Engineering Center, China Academy of Space Technology, Beijing 100029, China; 2. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China) |
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| Abstract: | Single event effects on DC/DC converter are investigated under loaded and off-loaded bias based on Kr ion irradiation from accelerator. Results under two bias are analyzed. The voltage between drain and source of MOSFETs exceeds its own breakdown voltage during irradiation, which leads to the DC/DC converter function failure. The radiation hardness design of the power system based on DC/DC and inner MOSFETs choice is suggested. |
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| Keywords: | DC/DC converter single event effects MOSFETs single event burnout ground test |
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