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脉冲激光试验在宇航器件和电路系统抗单粒子效应设计中的初步应用
引用本文:韩建伟,封国强,蔡明辉,马英起,上官士鹏,陈睿,张玉靖.脉冲激光试验在宇航器件和电路系统抗单粒子效应设计中的初步应用[J].航天器环境工程,2011,28(2):121-125.
作者姓名:韩建伟  封国强  蔡明辉  马英起  上官士鹏  陈睿  张玉靖
作者单位:1. 中国科学院,空间科学与应用研究中心,北京,100190
2. 中国科学院,空间科学与应用研究中心,北京,100190;中国科学院,研究生院,北京,100049
基金项目:国家自然科学基金项目,中国科学院知识创新工程青年基金项目
摘    要:抗单粒子效应加固是宇航器件研发和卫星电路系统设计面临的重要难题.准确、有效的单粒子效应试验评估对此问题的解决有巨大帮助.中国科学院空间科学与应用研究中心于近十年在国内自主发展了用于单粒子效应评估的脉冲激光试验相关装置、试验技术和方法,对宇航器件和卫星电路开展了初步应用.通过脉冲激光试验,能够快速甄别、定位宇航器件试样的...

关 键 词:单粒子效应  宇航器件  卫星电路系统  脉冲激光

Applications of pulsed laser test on single event effect hardening for aerospace components and circuit systems
Han Jianwei,Feng Guoqiang,Cai Minghui,Ma Yingqi,Shangguan Shipeng,Chen Rui,Zhang Yujing.Applications of pulsed laser test on single event effect hardening for aerospace components and circuit systems[J].Spacecraft Environment Engineering,2011,28(2):121-125.
Authors:Han Jianwei  Feng Guoqiang  Cai Minghui  Ma Yingqi  Shangguan Shipeng  Chen Rui  Zhang Yujing
Institution:1(1.Center for Space Science and Applied Research,Chinese Academy of Sciences,Beijing 100190,China; 2.Graduate School,Chinese Academy of Sciences,Beijing 100049,China)
Abstract:Single event effect(SEE) hardening is a challenge in the development and design of components and circuit systems for space applications,where an accurate and efficient evaluation of SEE by test is essential.In the past decade or so,the Center for Space Science and Applied Research of Chinese Academy of Sciences developed facilities and methods for single event effect tests by using pulsed laser,and carried out some preliminary tests on aerospace components and circuit systems.The pulsed laser facilities can be used to identify and locate SEE vulnerable points on the prototype of chips,as well as to evaluate the general SEE response of the whole chips.As for the circuit systems,the pulsed laser facility can not only provide principal evaluations on the SEE characteristics for candidate components,but also test and verify the radiation hardening design by means of spatial scanning of chips and time testing of the circuit.
Keywords:single event effects  aerospace components  spaceborne circuit systems  pulsed laser
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