| 星载计算机抗辐射加固技术 |
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| 引用本文： | 华更新,王国良,郭树玲.星载计算机抗辐射加固技术[J].航天控制,2003,21(1):10-15. |
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| 作者姓名： | 华更新 王国良 郭树玲 |
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| 作者单位： | 北京控制工程研究所,北京,100080 |
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| 摘 要： | 为掌握星载计算机系统级抗辐射加固技术 ,针对星载计算机的抗辐射薄弱环节 ,研究抗辐射加固措施 ,完成了 386ex三机变结构原理样机。重点研究了抗单粒子效应多机容错技术和存储器校验技术 ,抗总剂量效应屏蔽材料和屏蔽工艺。最后研究了实时多任务操作系统及其抗辐射问题。
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| 关 键 词： | 星载计算机 辐射加固 单粒子效应 总剂量效应 |
| 修稿时间： | 2002年10月15 |
Radiation Hardening Techniques for On-board Computers |
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| Hua Gengxin\ Wang Guoliang\ Guo Shuling Beijing Institute of Control Engineering,Beijing.Radiation Hardening Techniques for On-board Computers[J].Aerospace Control,2003,21(1):10-15. |
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| Authors: | Hua Gengxin\ Wang Guoliang\ Guo Shuling Beijing Institute of Control Engineering Beijing |
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| Institution: | Hua Gengxin\ Wang Guoliang\ Guo Shuling Beijing Institute of Control Engineering,Beijing 100080 |
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| Abstract: | The thesis is aimed at to master the system level radiation hardening techniques of OBC. For the weakness of non radiation hardening OBC , we have accomplished the 386 ex prototype of flexible triple modular redundancy architecture. We focuses attention on multi-modular redundancy and error detection and correction of memory chips for SEU protection, RH materials and shielding techniques for total ionizing dose damage. Finally the real-time multitask operating system and software RH technique are studied. |
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| Keywords: | On board computer (OBC) \ Radiation hardening (RH) \ Single event upset (SEU) \ Total ionizing dose |
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