一种检测和校正存储器双错的低冗余加固方法

为了提高宇航用存储器的抗单粒子翻转能力，本文对传统的单错误修正、双错误探测（Single Error Correction and Double Error Detection, SEC DED）码的构造进行了改进和优化，给出了构建单错校正、双错检测、相邻双错校正（Single Error Correction, Double Error Detection and Double Adjacent Error Correction, SEC DED DAEC）码奇偶校验矩阵的构造规则。通过适当地增加奇偶校验矩阵列向量的权重和、改变奇偶校验矩阵列向量顺序的方式，提出了一种具有新特征结构的SEC DED DAEC码，它可以修正任意相邻两位错误。实验结果表明，提出的SEC DED DAEC码是一种有效的宇航用存储器抗单粒子翻转加固措施，其冗余开销基本与传统的SEC DED码相同，误码率低于国际同类文献的结果。

A Low Redundancy Radiation Hardened Scheme for Double Error Detectionand Correction in Memories

In order to provide adequate protection for astronautic memory against single event upsets, a constructing rule of parity check matrix of SEC DED DAEC (Single Error Correction Double Error Detection and Double Adjacent Error Correction) codes by improving and optimizing conventional SEC DED (Single Error Correction Double Error Detection) codes is proposed in this paper. Through both properly increasing the weights of column vectors and changing the order of column vectors, new SEC DED DAEC codes with low error code rate are proposed. The experiment results reveal that redundancy overhead of the proposed scheme is the same as that of conventional SEC DED codes while its error code rate is lower than the best known SEC DED DAEC codes.