| 赛灵思静态随机存储器型FPGA单粒子翻转检测 |
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| 引用本文： | 吕达,吴飞,陆华.赛灵思静态随机存储器型FPGA单粒子翻转检测[J].航天器工程,2010,19(6):96-101. |
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| 作者姓名： | 吕达 吴飞 陆华 |
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| 作者单位： | 航天恒星科技有限公司,北京100086 |
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| 摘 要： | 以XILINX XC2V3000现场可编程门阵列（FPGA）为例,分别通过ICAP和Selectmap接口对配置存储器进行回读检测,并通过局部动态重构的方法实现了故障注入,对单粒翻转（SEU）检测方法进行验证。结果证明回读与重配置是进行FPGA抗SEU设计的有效方法。
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| 关 键 词： | 现场可编程门阵列 单粒子翻转 配置存储器 检测 |
Detecting Single-event Upsets for XILINX SRAM-Based FPGA |
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| LU Da,WU Fei,LU Hua.Detecting Single-event Upsets for XILINX SRAM-Based FPGA[J].Spacecraft Engineering,2010,19(6):96-101. |
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| Authors: | LU Da WU Fei LU Hua |
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| Institution: | (Space Star Technology Co. Ltd.,Beijing 100086,China) |
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| Abstract: | The configuration memory of XC2V3000 is readback through ICAP and Selectmap,and the configuration data are verified. The simulation of SEU is implemented by reconfigurating one frame of configuration memory with different data. The results show that readback and reconfi-guration of the SRAM based FPGA is an effective way to mitigate SEU. |
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| Keywords: | FPGA SEU configuration memory detection |
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