| 预防CMOS电路锁定效应的措施 |
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| 引用本文： | 沈雅琴.预防CMOS电路锁定效应的措施[J].上海航天,1996(2):24-28. |
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| 作者姓名： | 沈雅琴 |
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| 作者单位： | 航天工业总公司八院５０９所 |
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| 摘 要： | 对ＣＭＯＳ集成器件的锁定效应从结构上进行了分析，提出了电压触发型销定和电流积累型销定的观点，阐述了ＣＭＯＳ电路系统的保护、使用方法。防锁定效应的措施。实际使用表明，所提出的防锁定效应的措施是有效的。
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| 关 键 词： | ~＋器件结构，~＋锁定效应，~＋预防措施，~＋使用方法，电路保护 |
THE MEASURES OF PREVENTION OF LOCKING EFFECT OF CIOS CIRCUIT |
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| Sheng Yaqing.THE MEASURES OF PREVENTION OF LOCKING EFFECT OF CIOS CIRCUIT[J].Aerospace Shanghai,1996(2):24-28. |
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| Authors: | Sheng Yaqing |
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| Abstract: | The structure of CMOS integrated device is analyzed andworking mechanism of locking effect is discovered. The viewpoint of voltage-trigger locking and current-accumulation locking is advanced.Thispaper also explaines the protect measure of CMOS circuit system and itsoperation method and prevention measure of locking effect. |
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| Keywords: | ~ Device structure ~ Locking effect ~ Prevention measure ~ Operation method Circuit protection |
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