| 航天器介质充电效应模拟试验中的非接触式电位转接测量技术 |
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| 引用本文： | 郑耀昕,张振龙,郑汉生,韩建伟.航天器介质充电效应模拟试验中的非接触式电位转接测量技术[J].航天器环境工程,2016,33(2):211-215. |
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| 作者姓名： | 郑耀昕 张振龙 郑汉生 韩建伟 |
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| 作者单位： | 中国科学院国家空间科学中心, 北京 100190;中国科学院大学, 北京 100049;中国科学院国家空间科学中心, 北京 100190;中国科学院国家空间科学中心, 北京 100190;中国科学院大学, 北京 100049;中国科学院国家空间科学中心, 北京 100190 |
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| 摘 要： | 航天器充放电效应地面模拟试验中需要测量的一个重要参数是介质的充电电位。文章基于介质充电电位的非接触式转接测量技术,分析了测量中引起误差的各个因素,讨论了减小测量误差和提高转接测量分辨率的方法,并进行试验验证。据此设计了一套介质电位非接触式转接测量系统,其测量分辨率达到10 V以下,且由电荷泄漏引起的测量误差1%,能够满足航天器介质充电电位的测量要求。
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| 关 键 词： | 航天器充电效应 电位测量 非接触式测量 分辨率 |
| 收稿时间： | 2015/9/23 0:00:00 |
| 修稿时间： | 2016/3/20 0:00:00 |
Non-contact transferred potential measurement technology in ground testing for spacecraft dielectric charging effect simulation |
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| Zheng Yaoxin,Zhang Zhenlong,Zheng Hansheng and Han Jianwei.Non-contact transferred potential measurement technology in ground testing for spacecraft dielectric charging effect simulation[J].Spacecraft Environment Engineering,2016,33(2):211-215. |
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| Authors: | Zheng Yaoxin Zhang Zhenlong Zheng Hansheng and Han Jianwei |
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| Institution: | National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China;University of Chinese Academy of Sciences, Beijing 100049, China;National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China;National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China;University of Chinese Academy of Sciences, Beijing 100049, China;National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China |
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| Abstract: | The dielectric charging potential is one of the important parameters to be measured in the charging and discharging effect simulation test. A non-contact transferred measurement method is presented, the influencing factors on the measurement errors are analyzed, the methods for improving the transferred measurement resolution are proposed, and a non-contact measurement system with a transfer mechanism is designed. The validation test results show that the resolution of the dielectric charging voltage is less than 10 V, and the error caused by the charge leakage is less than 1%. The system can meet the requirements of the spacecraft dielectric charging potential measurement. |
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| Keywords: | spacecraft charging effect potential measurement non-contact measurement resolution |
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