Single event upset investigations on the “Flying Laptop” satellite mission |
| |
Authors: | Christoph Noeldeke Maximilian Boettcher Ulrich Mohr Steffen Gaisser Mikel Alvarez Rua Jens Eickhoff Mike Leslie Matt Von Thun Sabine Klinkner Renuganth Varatharajoo |
| |
Institution: | 1. Tesat-Spacecom GmbH & Co. KG, Backnang, Germany;2. Institute of Space Systems, University of Stuttgart, Germany;3. Airbus Defence and Space GmbH, Immenstaad, Germany;4. Cobham Advanced Electronic Solutions, Semiconductor and Space Solutions, Colorado Springs, USA;5. Department of Aerospace Engineering, Universiti Putra Malaysia, Malaysia |
| |
Abstract: | The radiation effects in electronic parts are called single-event effects, which are deemed to be critical for space missions. This paper presents the Single Event Upsets that were observed in an onboard memory device of the Low Earth Orbit “Flying Laptop” satellite mission during its in-orbit operation. The Single Event Upsets were carefully mapped on the satellite orbital space itself and their root causes were investigated together with their rates of occurrence. Subsequently, the events were traced to show several root cause sources such as (i) trapped energetic protons leaking to low altitudes within the South Atlantic Anomaly, (ii) Solar Energetic Particles emitted by an impulsive event on 10 September 2017, and (iii) Galactic Cosmic Rays. A profound analysis was carried out on the observed flight data, and its corresponding results are actually in agreement with the standard energetic particle models. The presented results provide another important insight on the Single Event Upsets for future Low Earth Orbit satellite missions. |
| |
Keywords: | Single Event Upsets (SEUs) LEO radiation EDAC SRAM “Flying Laptop” satellite |
本文献已被 ScienceDirect 等数据库收录! |
|