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星上电子元器件快速动态测试
引用本文:程鹏,陈皓,韩冰.星上电子元器件快速动态测试[J].宇航计测技术,2000,20(5):29-39.
作者姓名:程鹏  陈皓  韩冰
作者单位:航天机电集团二院203所
摘    要:介绍了星上电子元器件快速动态测试的主要技术指标、工作原理。重点介绍了星上电子设备所用介质材料介电常数及快速动态测试方法;星上电子元器件噪声系数快速动态测试方法和星上电子元器件幅频特性快速动态测试方法,包括测试原理、测试步骤及误差分析,并且分析了其应用前景,建议推广使用。

关 键 词:卫星      
修稿时间:1999年9月20

Automatic dynamic testing technology of electronic elements devices in the satellite
Cheng Peng,Chen Hao,Han Bing.Automatic dynamic testing technology of electronic elements devices in the satellite[J].Journal of Astronautic Metrology and Measurement,2000,20(5):29-39.
Authors:Cheng Peng  Chen Hao  Han Bing
Institution:Cheng Peng; Chen Hao; Han Bing
Abstract:This report describes some details about the researching theme of" automatic dynamic tasting technology of electronic elements devices in the satellite". Source of the task, main technology requirements and operation theory was included inside. There are three main parts in-this researching theme including dynamic testing methods of dielectric constant of media materials, noise figure and amplitude-frequency characteristic for the electronic elements and devices in the satellite. Also presented in the report are the principle of the testing, testing steps methods, and the analysis about the testing errors. After having analyzed the prospect of the application, it was proved successful and propagable.
Keywords:Satellite  Electronic device  Dynamic test  
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