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| 基于数据质量的机电系统BIT虚警研究 | |
| 引用本文： | 刘猛,石山. 基于数据质量的机电系统BIT虚警研究[J]. 航天控制, 2009, 27(1) |
| 作者姓名： | 刘猛 石山 |
| 作者单位： | 空军工程大学工程学院,西安,710038 |
| 摘 要： | 机电系统机内自测试(BIT)虚警问题一直是困扰其发展和应用的重要因素.本文首先明确了数据质量在机电BIT检测过程中的作用,对数据质量的属性及数据异常判断方法做了简要介绍.在分析了数据异常将可能导致BIT虚警之后,提出在BIT诊断和决策前加入数据异常判断环节,分析结果表明,此方法能够有效地降低机电BIT系统虚警率,提高其故障检测率. |
| 关 键 词： | BIT虚警 数据质量 故障检测率 |
Research of Mechatronic Built-in Test System Based on Data Quality |
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| LIU Meng,SHI Shan. Research of Mechatronic Built-in Test System Based on Data Quality[J]. Aerospace Control, 2009, 27(1) | |
| Authors: | LIU Meng SHI Shan |
| Affiliation: | LIU Meng SHI ShanAirforce Engineering University Engineering College,Xi'an 710038,China |
| Abstract: | False alarm is a dominating problem obstructing the development and application of the mechatronic BIT.This paper firstly presents the importance of data quality in the process of BIT.Then it introduces the data property and how to judge the data abnormal.After analyzing that abnormal data may result in BIT false alarm,it brings forward the method to put a data-judging tache before diagnosing.Analyzing result indicates that this method is efficient to reduce the false alarm and increase the fault detecting ... |
| Keywords: | Built-in test False alarm Data quality Fault detecting rate |
| 本文献已被 CNKI 万方数据 等数据库收录！ | |