| X射线衍射全谱拟合法测定碳/碳复合材料的点阵常数 |
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| 引用本文： | 王晓叶,李同起,郑,斌,冯志海,李仲平.X射线衍射全谱拟合法测定碳/碳复合材料的点阵常数[J].宇航材料工艺,2010,40(2). |
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| 作者姓名： | 王晓叶 李同起 郑 斌 冯志海 李仲平 |
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| 作者单位： | 航天材料及工艺研究所先进功能复合材料技术国防科技重点实验室,北京,100076 |
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| 摘 要： | 利用X射线衍射仪,采用全谱拟含的方法,测定三种不同碳材料的点阵常数、石墨化度及微晶参数,测得三种碳材料(每个样品重复5次试验)六方晶系的a的标准偏差小于2.0×10~(-3),c的标准偏差小于1.4×10~(-3),石墨化度(g)的标准偏差小于1.5,微晶参数(L_(c002))的标准偏差小于0.5,是一种有效的测试碳材料晶体参数的方法.
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| 关 键 词： | X射线衍射仪 全谱拟合法 点阵常数 石墨化度 微晶参数 |
DeterminationofLatticeConstantsforC/CCompositesbyUsingX-ray DiffractionTechniqueandRietveldRefinementMethod |
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| Institution: | NationalKeyDefenseLaboratoryofAdvancedFunctionalCompositeMaterials,AerospaceResearch InstituteofMaterials&ProcessingTechnology,Beijing 100076 |
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| Abstract: | Graphitization degree, lattice constant and crystallite sizes of three kinds of C/C composites were measured by rietveld refinement method ( whole spectrum fitting) of X-ray diffraction. The results show that standard deviation of crystal the parameter of the three C/C composites is less than 2.0 × 10~(-3), standard deviation of graphitization degree (g) is less than 1.5, standard deviation of crystallite sizes( L_(c002)) is less than 0.5. Rietveld refinement method of X-ray diffraction is effective for investigation of the crystal parameters of C/C composite. |
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| Keywords: | X-ray diffraction Rietveld refinement method Lattice constant Graphitization degree Crystallite sizes |
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