质子辐照Kapton/Al的蒙特卡罗模拟

采用蒙特卡罗方法(MC方法),模拟了质子辐照时质子的能量损失、射程、射程偏离及其产生的空位缺陷和电离能损分布。模拟结果表明:入射能量在10~300keV区间,Kapton/Al对入射质子的阻止本领主要取决于电子阻止本领,在80keV出现峰值,可作为地面模拟试验能量选取的参考;质子在Kapton/Al中的射程分布可近似看作高斯分布,质子射程及其偏离随能量增加而增加;位移缺陷和电离作用是两个相对的过程,低能时主要表现为位移缺陷,高能时表现为电离作用。

Monte-Carlo Simulation of Kapton/Al by Proton Irradiation

The distribution of energy loss, projected range, straggling, vacancies and ionization energy loss during proton irradiating is simulated by Monte-Carlo. Simulating results indicate that the electron stopping power is the main contribution to stopping power against the incident proton with an energy of 10~300 keV and a peak value of power occurs at 80 keV. This can be regarded as a reference for energy choosing in the simulation test on the ground. The distribution of range for proton in Kapton/Al is considered as the gauss distribution, and the proton range and its straggling is increased with the energy. The vacancy and ionization are two relative events and the vacancy event appear at low energy level while the ionization event appears at high energy level.