星载氮化镓固态功率放大器整机高可靠设计技术研究

为了满足星载应用对于固态功率放大器长寿命的应用需求，针对近年来研究较多的氮化镓（gallium nitride,GaN）固态功率放大器（solid state power amplifier,SSPA），阐述了器件存在的可靠性问题，提出了整机高可靠设计方法。首先，探讨了氮化镓器件的典型失效机理，给出了氮化镓器件在高场退化以及热退化方面的研究结果，分析了逆压电极化效应及热载流子效应引起器件退化的物理机制。其次，围绕降额设计、整机热设计以及电路稳定性设计，研究了如何针对氮化镓器件的特点实现星载固放的高可靠设计，并给出了典型的仿真及实验结果。最后，给出了典型的星载固态功率放大器空间环境模拟试验结果，产品在热真空试验、温循老炼以及高温老炼等试验过程中表现出了较高的稳定性和一致性，为氮化镓固态功率放大器的上星应用提供了有力的支撑。

Research on high reliability design technology of GaN solid state power amplifier for satellite application

To meet the long-life requirements of satellite system on solid state power amplifier, the reliability of GaN devices, which has been widely studied in recent years, was investigated. Besides, the high reliability design method of GaN SSPA was expounded. Firstly, the failure mechanism of GaN devices under high voltage and high temperature was analyzed, and the impacts of the inverse piezoelectric effect and the hot carrier effect on the devices were discussed. Then the high reliability design method of GaN SSPA based on the derating design, thermal design, and stability design was investigated, and the typical simulation and experimental results were given. Lastly, the space environment simulation test experiment result of typical GaN SSPA was given. The tested product shows high reliability and consistency during the thermal vacuum test, thermal cycling burn-in test and high temperature burn-in test, which provides strong support for satellite application.