使用T3Ster对宇航电子元器件内部热特性的测量

文章介绍了使用MicReD公司的热测试仪33Ster测量元器件内部热特性的方法。T3Ster测试仪可以测试各类IC、LED、散热器、热管等电子器件的热特性以及PCB、导热材料等的热阻、热客及导热系数、接触热阻等热特性。使用33Ster测试仪对某航天器用电子元器件内部热特性进行了测量，并与器件资料中的热特性数据进行比对，二者相对误差为0．07％，验证了q3Ster测试仪具有测试高可靠度要求的宇航级电子元器件热特性的能力。为宇航电子元器件的热设计与热分析提供重要的试验依据。

Internal thermal performance measurement of electronic elements in space by T3Ster

Thermal transient tester -T3ster is a product of MicRed. inc. T3Ster can be used to characterize IC, LED or thermal management devices such as heat sinks and heat pipes. Furthermore, T3Ster can also be used for characterizing the thermal performance of PCB and thermal conduction materials. In this paper, T3Ster is used to measure the internal thermal performance of an electronic element used in space, which has a good coherence with the thermal performance data in the elements datasheet. The consistency proves that T3Ster can test the thermal performance of space-level electronic elements. The thermal design and thermal analysis of Space-level electronic elements can be the perfect experiment insurance by T3Ster.