Multi-objective evolutionary design of selective triple modular redundancy systems against SEUs |
| |
Authors: | Yao Rui Chen Qinqin Li Zengwu Sun Yanmei |
| |
Affiliation: | College of Automation and Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China |
| |
Abstract: | To improve the reliability of spaceborne electronic systems,a fault-tolerant strategy of selective triple modular redundancy(STMR)based on multi-objective optimization and evolvable hardware(EHW)against single-event upsets(SEUs)for circuits implemented on field programmable gate arrays(FPGAs)based on static random access memory(SRAM)is presented in this paper.Various topologies of circuit with the same functionality are evolved using EHW firstly.Then the SEU-sensitive gates of each circuit are identified using signal probabilities of all the lines in it,and each circuit is hardened against SEUs by selectively applying triple modular redundancy(TMR)to these SEU-sensitive gates.Afterward,each circuit hardened has been evaluated by SEU Simulation,and the multi-objective optimization technology is introduced to optimize the area overhead and the number of functional errors of all the circuits.The proposed fault-tolerant strategy is tested on four circuits from microelectronics center of North Carolina(MCNC)benchmark suite.The experimental results show that it can generate innovative trade-off solutions to compromise between hardware resource consumption and system reliability.The maximum savings in the area overhead of the STMR circuit over the full TMR design is 58%with the same SEU immunity. |
| |
Keywords: | Evolvable hardware Field programmable gate array Multi-objective approach Selective triple modular redundancy Single event upset |
本文献已被 CNKI 等数据库收录! |
|