The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

Models and methods in use for quantitative estimates of the occurrence of single event upsets in microchips of orbiting spacecraft are considered. A calculation and experimental technique for determining the rate of these effects is described, taking into account spatial and temporal distributions of the fluxes of high-energy particles in the space and their penetration through protective shields. Examples of its application for the orbit of the International Space Station are presented.