首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Progress in CMOS integrated measurement systems
Authors:Baltes  H Brand  O
Institution:Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich;
Abstract:Selected micro- and nano-systems developed recently at the Physical Electronics Laboratory of ETH Zurich are reviewed: (i) a fluxgate microsystem for detection of the Earth's magnetic field; (ii) a capacitive chemical sensor microsystem for detection of volatile organic compounds in air; and (iii) a parallel scanning AFM chip. The micro- and nano-systems combine sensor structures and readout circuitry on a single chip and are fabricated using industrial CMOS technology in combination with post-processing micromachining and film deposition
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号