| 临近空间大气中子诱发电子器件单粒子翻转模拟研究 |
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| 引用本文： | 张振力,张振龙,韩建伟,安广朋,蔡明辉,封国强,马英起.临近空间大气中子诱发电子器件单粒子翻转模拟研究[J].空间科学学报,2011,31(3). |
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| 作者姓名： | 张振力 张振龙 韩建伟 安广朋 蔡明辉 封国强 马英起 |
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| 作者单位： | 1. 中国科学院空间科学与应用研究中心,北京100190;中国科学院研究生院,北京100049
2. 中国科学院空间科学与应用研究中心,北京,100190 |
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| 基金项目： | 中国科学院创新基金课题资助 |
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| 摘 要： | 根据重离子试验数据,采用长方体(RPP)模型,用GEANT 4软件工具包编程,建立了垂直于器件表面入射的中子诱发电子器件的单粒子翻转模型.考虑敏感体积及其附近的次级粒子对单粒子翻转的贡献,统计了次级粒子在敏感体积内沉积能量的微分能谱分布,对在敏感体积内沉积不同能量的次级粒子对单粒子翻转的贡献进行了区分计算,模拟计算结果与地面试验结果符合较好.
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| 关 键 词： | 单粒子翻转 中子 敏感体积 weibull函数 |
Simulation Study on Single Event Upset Induced by Near Space Atmospheric Neutron in Electronic Devices |
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| ZHANG Zhenli,ZHANG Zhenlong,HAN Jianwei,AN Guangpeng,CAI Minghui,FENG Guoqiang,MA Yingqi.Simulation Study on Single Event Upset Induced by Near Space Atmospheric Neutron in Electronic Devices[J].Chinese Journal of Space Science,2011,31(3). |
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| Authors: | ZHANG Zhenli ZHANG Zhenlong HAN Jianwei AN Guangpeng CAI Minghui FENG Guoqiang MA Yingqi |
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| Institution: | ZHANG Zhenli~(1,2)ZHANG Zhenlong~1 HAN Jianwei~1 AN Guangpeng~1 CAI Minghui~1 FENG Guoqiang~1 MA Yingqi~(1,2) 1(Center for Space Science and Applied Research,Chinese Academy of Sciences,Beijing 100190) 2(Graduate University of Chinese Academy of Sciences,Beijing 100049) |
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| Abstract: | Single Event Upset(SEU)induced by atmospheric neutron is harmful for near space craft,and is studied by numeric simulation in present paper.Static Random-Access Memory(SRAM) device which has regularly arrayed cells is selected as the simulation object.Using Rectangular Parallelepiped(RPP)Model as the basic model and extracting key parameters from SEU experiment data of heavy ions,sensitive volume model of SEU due to nuclear reactions between incident neutron and device materials is established.Simulation an... |
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| Keywords: | Single event upset Neutron Sensitive volume Weibull function |
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