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面向低成本微纳卫星的快速试验体系研究
引用本文:杨晓宁,杨勇,王晶,刘守文,樊世超.面向低成本微纳卫星的快速试验体系研究[J].航天器环境工程,2016,33(1):13-20.
作者姓名:杨晓宁  杨勇  王晶  刘守文  樊世超
作者单位:北京卫星环境工程研究所 北京, 100094;机电产品环境可靠性试验技术北京市重点实验室 北京, 100094;北京卫星环境工程研究所 北京, 100094;机电产品环境可靠性试验技术北京市重点实验室 北京, 100094;北京卫星环境工程研究所 北京, 100094;机电产品环境可靠性试验技术北京市重点实验室 北京, 100094;北京卫星环境工程研究所 北京, 100094;机电产品环境可靠性试验技术北京市重点实验室 北京, 100094;北京卫星环境工程研究所 北京, 100094;机电产品环境可靠性试验技术北京市重点实验室 北京, 100094
基金项目:武器装备预先研究项目(编号:J1301010202)
摘    要:文章结合微纳卫星典型特点,分析了由此带来的试验新需求;对比传统卫星试验标准和即将发布的国外微纳卫星试验标准草案,提出在充分继承传统卫星试验技术成果基础上,针对国内微纳卫星发展现状,兼顾灵活性和COTS(commercial off-the-shelf)产品可靠性保证需求,构建国内微纳卫星快速试验体系的总体思路。

关 键 词:微纳卫星  低成本  快速交付  试验体系  COTS  产品
收稿时间:2015/10/26 0:00:00
修稿时间:2016/1/13 0:00:00

Study on fast test system for low cost micro/nano satellites
Yang Xiaoning,Yang Yong,Wang Jing,Liu Shouwen and Fan Shichao.Study on fast test system for low cost micro/nano satellites[J].Spacecraft Environment Engineering,2016,33(1):13-20.
Authors:Yang Xiaoning  Yang Yong  Wang Jing  Liu Shouwen and Fan Shichao
Institution:Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China;Beijing Key Laboratory of Environment & Reliability Test Technology for Aerospace Mechanical & Electrical Products, Beijing 100094, China;Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China;Beijing Key Laboratory of Environment & Reliability Test Technology for Aerospace Mechanical & Electrical Products, Beijing 100094, China;Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China;Beijing Key Laboratory of Environment & Reliability Test Technology for Aerospace Mechanical & Electrical Products, Beijing 100094, China;Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China;Beijing Key Laboratory of Environment & Reliability Test Technology for Aerospace Mechanical & Electrical Products, Beijing 100094, China;Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China;Beijing Key Laboratory of Environment & Reliability Test Technology for Aerospace Mechanical & Electrical Products, Beijing 100094, China
Abstract:The paper analyzes some new test requirements for micro/nano satellites according to their typical characteristics, as compared to the traditional test standard and ISO draft standard for micro/nano satellites, and then puts forward a general framework of a fast test system for micro/nano satellites. The idea is based on the traditional satellite test technologies and achievements, combined with the current development of micro/nano satellite in China; the flexibility and reliability requirements of COTS (commercial off-the-shelf) products are also taken into account.
Keywords:micro/nano satellites  low cost  fast delivery  test system  COTS products
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