SRAM型FPGA的单粒子效应及TMR设计加固

宇宙空间中存在多种高能粒子,其辐射效应会严重威胁航天器中现场可编程门阵列（FieldProgrammable Gate Array,FPGA）器件工作的可靠性。文章研究了静态随机存储器型（Static Random AccessMemory,SRAM）FPGA中的单粒子翻转效应。理论计算表明,采用三模冗余（Triple Module Redundancy,TMR）设计方法可以有效缓解FPGA中的单粒子翻转问题。针对传统TMR设计方法的不足,提出了一种改进的TMR设计架构,并将该架构应用于某星载关键控制电路的设计中。文中的研究成果对SRAM型FPGA的空间应用有一定参考作用。

Single-event Effects on and TMR Radiation-harden of SRAM-based FPGA

The radiation effects of various high-energy particles in space seriously decrease the reliability of field programmable gate arrays(FPGA) in spacecraft.In this paper,Single-event upsets(SEUs) occurring in SRAM-based field programmable gate array are studied,and theoreticly calculation illustrates that the triple module redundancy(TMR) methodology can release the damage resulted by SEU.An improved TMR architecture is introduced based on the traditional one.Then this architecture is applied to a SEU sensitive control circuit of a certain satellite.The calculated result and the improved TMR architecture may have certain reference value for the space applications of the SRAM-based FPGA.