基于半导体制冷的星载CCD测试用低温环境装置设计

文章设计了一种基于半导体制冷的星载CCD测试用低温环境装置。该装置结合热电制冷器和抗积分饱和PID控制算法，以ARM内核的微控制器作为主控芯片，采用温度传感器采集温度信息，以脉冲宽度调制（PWM）技术控制热电制冷器的制冷功率，利用水冷散热装置散发热电制冷器发出的热量，实现制冷温度的精确控制。该装置低温箱小巧轻便，可装配于CCD测试暗箱内，利用暗箱壁上的通光孔设计，可实现低温环境下CCD明、暗场全参数测试，满足了宇航用CCD测试的高可靠需求。

Design of a low-temperature equipment for spaceborne CCD test based on semiconductor refrigeration

A low-temperature device for the spaceborne CCD test based on the dual-cycle water-cooled semiconductor refrigeration is designed. It is based on a thermoelectric cooler with an anti-saturation PID control algorithm. The precise control of the cooling temperature is achieve by taking an ARM core microcontroller as the main control chip a temperature sensor to collect the temperature information, the adoption of the pulse width modulation (PWM) technology to control the cooling capacity of the thermoelectric cooler, and a water-cooled heat dissipation device used for dissipating the heat generated from the cooler. The device is portable enough to be fixed into the dark chamber for the CCD test. Meanwhile, a light hole in the wall of the device is used for the high-reliable parameter test of the spaceborne CCD both in the light field and in the dark field under the low temperature environment.