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电磁脉冲作用下计算机死机故障研究
引用本文:侯民胜,田宇.电磁脉冲作用下计算机死机故障研究[J].航天电子对抗,2009,25(6):47-49,57.
作者姓名:侯民胜  田宇
作者单位:北京航空工程技术研究中心,北京,100076
摘    要:为研究核电磁脉冲对计算机系统的效应,利用核电磁脉冲源产生的模拟核电磁脉冲,对单片机系统进行了辐照效应实验。实验表明,单片机系统在核电磁脉冲作用下,可出现死机等多种故障现象。在实验的基础上,分析了死机产生的原因及加固方法,并通过实验验证了指令冗余、软件陷阱和看门狗等措施对防止单片机死机的有效性。

关 键 词:核电磁脉冲  单片机系统  死机  加固

Study on computer breakup under EMP
Hou Minsheng,Tian Yu.Study on computer breakup under EMP[J].Aerospace Electronic Warfare,2009,25(6):47-49,57.
Authors:Hou Minsheng  Tian Yu
Institution:(Beijing Research Center of Aerial Engineering Technology,Beijing 100076,China)
Abstract:In order to study the electromagnetic pulse(EMP) effects to computer systems, using nuclear electromagnetic pulse(NEMP) generated by NEMP source, the irradiation effects experiments to single chip computer system are made. The experiments show that various kinds of failures such as breakup may be occurred when single chip computer system is irradiated by NEMP. Based on the experiments, the reason of breakup and hardening technology are studied. The validity of instruction redundancy, software trap and watchdog for anti-breakup are validated by experiments.
Keywords:nuclear electromagnetic pulse  single chip computer system  breakup  hardening
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