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航天电子对抗设备的可靠性验证研究
引用本文:侯先荣.航天电子对抗设备的可靠性验证研究[J].南京航空航天大学学报,1994(Z2).
作者姓名:侯先荣
作者单位:航天工业总公司8511研究所
摘    要:航天电子对抗设备的可靠性验证属国内外可靠性工程界的一个难题——极小子样长寿命或高可靠电子系统的可靠性验证问题。为解决这一难题,本文提出了一种简便实用的工程方法。该方法先采用元器件应力分析法从工程上计算出系统在一定应力条件下的失效率,参考能反映该产品可靠性的历史数据,初步评估出其任务可靠性和基本可靠性。然后,根据初步评估过程中得到的整机在正常应力与设定加速应力条件下的失效率,求出整机加速验证试验的加速因子和总试验时间,据此来设计并完成加速试验。最后;根据加速试验得到的数据,结合初步评估结果,综合评定系统的实际可靠性水平,文末给出了该方法的应用范围及一个在航天工程中的应用实例。

关 键 词:电子设备,可靠性验证,极小子样,长寿命(高可靠),加速试验,验证方案

On the Reliability Demonstration for Aerospace Electronic Warfare Equipment
Hou Xianrong.On the Reliability Demonstration for Aerospace Electronic Warfare Equipment[J].Journal of Nanjing University of Aeronautics & Astronautics,1994(Z2).
Authors:Hou Xianrong
Abstract:The reliability demonstration for aerospace electronic warfare equipment,a reliability demonstration of minimum sample and long life(or high-reliable)electronic system,is a difficult subject at home and abroad.A new simple and practical engineering method to solve this problem is developed.This method, a reliability demonstration plan of minimum sample and long life electronic equipment, can be divided into the following steps:First, by the analysis of failure rate of the system under study according to the elements stress analysis method and referring to the historical data which can show the system reliability,we can estimate the system's mission reliability and basic reliability preliminarily. Then, according to the failure rate obtained in the first step under the normal stress and given accelerated stress, we can calculate the acceleration factor and the total testing time of the system,and design and fulfill the acceleration test. Finally, by combining the data resulted from the acceleration test and the above preliminary estimation results,we can assess the system's practical reliability level synthetically. The application range of the developed demonstration plan is pointed out and an example of application to aerospace engineering is given.
Keywords:electronic equipment  reliability demonstration  minimum sample  long-life (highreliable)  accelerated test  demonstration plan
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