| 厚膜铂电阻测温元件 |
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| 引用本文： | 王兴斌.厚膜铂电阻测温元件[J].宇航计测技术,1990(4):35-42. |
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| 作者姓名： | 王兴斌 |
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| 作者单位： | 重庆仪表材料研究所 高级工程师 |
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| 摘 要： | 厚膜铂电阻是80年代推出的新一代铂电阻测温元件。以铂浆料代替铂丝,用印刷工艺制成版图代替丝绕,用激光调值代替手工调值,用破璃浆料复层代替绝缘物封装。生产成本低,特性符合 IEC 标准,响应速度快,抗冲击、振动,可靠性高,用途广泛。本文综述这种测温元件的发展背景、结构特点、工艺、性能及应用前景。
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| 关 键 词： | 温度测量 厚膜铂电阻 电阻温度计 结构工艺 性能分析 |
Thick-film Pt resistance temperature detectors |
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| Wang Xingbin.Thick-film Pt resistance temperature detectors[J].Journal of Astronautic Metrology and Measurement,1990(4):35-42. |
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| Authors: | Wang Xingbin |
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| Institution: | Wang Xingbin |
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| Abstract: | This paper gives a review of thick-film PRTD's construction, production process,performance,application prospect and development in this country and abroad.They are a new generation PRTD manufactured in modern printing technology and have operational characteristics of faster thermal response,better resistance to vibration and shock,higher stabi- lity and reliability and lower cost.Thick-film PRTD offers replacement for conventional wire wound PRTD made to international specifications. |
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| Keywords: | Temperature measurement Thick-film Pt resistor Resistance thermometer Structural manufacturing process Performance analysis |
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