Modified Generalized Sign Test Processor for 2-D Radar |
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Authors: | Trunk GV Cantrell BH Queen FD |
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Institution: | Naval Research Laboratory Washington, D.C. 20375; |
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Abstract: | The modified generalized sign test processor is a nonparametric, adaptive detector for 2-D search radars. The detector ranks a sample under test with its neighboring samples and integrates (on a pulse-to-pulse basis) the ranks with a two-pole filter. A target is declared when the integrated output exceeds two thresholds. The first threshold is fixed and yields a 10-6 probability of false alarm when the neighboring samples are independent and identically distributed. The second threshold is adaptive and maintains a low false-alarm rate when the integrated neighboring samples are correlated and when there are nonhomogeneities, such as extraneous targets, in the neighboring cells. Using Monte Carlo techniques, probability of false-alarm results, probability of detection curves, and angular accuracy curves have been generated for this detector. The detector was built and PPI photographs are used to indicate the detector's performance when the radar is operated over land clutter. |
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