| 精密电容测微仪无基准校正研究 |
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| 引用本文： | 傅敬业,赵玉春,李跃平,闫明,郑义忠,叶声华.精密电容测微仪无基准校正研究[J].宇航计测技术,2000,20(6):19-23. |
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| 作者姓名： | 傅敬业 赵玉春 李跃平 闫明 郑义忠 叶声华 |
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| 作者单位： | 傅敬业
赵玉春
李跃平
闫明
郑义忠
叶声华 |
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| 基金项目： | 国家自然科学基金重点资助项目,资助号:59735120 |
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| 摘 要： | 介绍了一种电容测微仪的无基准校正方法,并就其工作原理进行了讨论.采用这种方法不需要其他高准确度基准,仅利用两相同准确度的电容传感器和无基准校正装置即可进行多次相互校准,最终得到各自准确度达到自身能力极限的校正结果.
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| 关 键 词： | +电容测微仪 +无基准校正 研究 |
| 修稿时间： | 2000年1月11日 |
Study on standardless-calibration of precision measurement system for capacitance transducers |
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| Fu Jingye,Zhao Yuchun,Yan Ming\ Zheng Yizhong.Study on standardless-calibration of precision measurement system for capacitance transducers[J].Journal of Astronautic Metrology and Measurement,2000,20(6):19-23. |
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| Authors: | Fu Jingye Zhao Yuchun Yan Ming\ Zheng Yizhong |
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| Institution: | Fu Jingye Zhao Yuchun Yan Ming\ Zheng Yizhong |
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| Abstract: | A standardless-calibration method are proposed for calibrating precision measurement system of capacitance transducers with nanometer resolution and the basic characteristics of the method are discussed. Without any special standard, the linearity errors of a pair of capacitance transducers can be calibrated themselves within their performance limitations. |
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