首页 | 本学科首页   官方微博 | 高级检索  
     检索      


X-ray study of accretion flow in narrow-line Seyfert 1 galaxies
Authors:Y Haba  Y Terashima  H Kunieda  K Ohsuga
Institution:1. Institute of Space and Astronautical Science, 3-1-1 Yoshinodai, Sagamihara 229-8510, Japan;2. Yukawa Institute for Theoretical Physics, Kyoto University, Sakyo-ku, Kyoto 606-8502, Japan
Abstract:We present the results of a systematic study of narrow-line Seyfert 1 galaxies (NLS1s) observed with XMM-Newton. The 2–12 keV X-ray spectra of NLS1s are well represented by a single power law with a photon index Γ ∼ 2. When this hard power law continuum is extrapolated into the low energy band, we found that all objects in our sample show prominent soft excess emission. This excess emission is well parameterized by the thermal emission expected from an optically thick accretion disk, and we found the following three peculiar features: (1) The derived disk temperatures are significantly higher than the expectation from a standard Shakura-Sunyaev accretion disk, if we assume a central mass of a black hole to be 106–8M. (2) The temperatures are distributed within narrow range (ΔkT ∼ 0.08 keV) with an average temperature of 0.18 keV in spite of the range of four orders of magnitude in luminosity (1041–45 erg s−1). (3) We found a peculiar temperature–luminosity relation, where the luminosity seems to be almost saturated in spite of the significant change in temperature, during the observations of the most luminous NLS1 PKS 0558-504. These results strongly suggest that the standard accretion disk picture is no longer appropriate in the nuclei of NLS1s. We discuss a possible origin for the soft excess component, and suggest that a slim disk may be able to explain the observational results, if the photon trapping effect is properly taken into account.
Keywords:X-ray  Active galactic nuclei  Narrow-line Seyfert 1 galaxies  PKS 0558-504  Accretion disk  Slim disk  Photon trapping effect
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号