| 基于红外热像仪测温原理的物体表面发射率计算 |
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| 引用本文： | 吴燕燕,罗铁苟,黄杰,郭芳.基于红外热像仪测温原理的物体表面发射率计算[J].直升机技术,2011(4):25-29. |
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| 作者姓名： | 吴燕燕 罗铁苟 黄杰 郭芳 |
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| 作者单位： | 中国直升机设计研究所,江西景德镇,333001 |
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| 摘 要： | 被测物体的发射率对红外热像仪测量温度的准确性影响突出.物质表面的发射率不仅取决于物质的内在性质,同时还取决于物质表面的各种物理状态,这些因素使得发射率的测量很复杂.从红外热像接收的有效辐射着手,获得两种计算发射率的方法,这两种方法简单实用.
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| 关 键 词： | 红外热像仪 发射率 测量温度 |
Calculation of Object Surface Emissivity Based on Measuring Temperature Principle of Thermal Imager |
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| Authors: | WU Yanyan LUO Tiegou YANG Xiaolong GUO Fang |
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| Institution: | WU Yanyan,LUO Tiegou,YANG Xiaolong,GUO Fang (China Helicopter Research and Development Institute,Jingdezhen 333001,China) |
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| Abstract: | Veracity of thermal image measuring temperature was mainly influenced by emissivity of object.Emissivity of matter surface lay on inward nature of matter and physics status of matter surface.These factors make measure emissivity was very complex.Two methods of calculating emissivity was based on thermal image receiving effective radiation.These methods were simpleness and practicality. |
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| Keywords: | thermal image emissivity measuring temperature |
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