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小电流测量单元校准技术研究
引用本文:徐迎春,莫玮,刘冲,于利红.小电流测量单元校准技术研究[J].宇航计测技术,2012,32(3):35-38.
作者姓名:徐迎春  莫玮  刘冲  于利红
作者单位:1. 广西桂林电子科技大学,桂林,540014
2. 中国电子技术标准化研究院,北京,100007
摘    要:在电子、航空航天领域及型号工程中小电流测试设备(如静电计、皮安表、源/测量单元、半导体精密分析仪等),发挥着极其重要的作用,其电流测量分辨力达到fA级,接近其物理极限值。对这些高灵敏度、高分辨力的精密小电流测量仪器进行参数校准是一项新的计量难题。本文使用Fluke公司5440B型直流电压源和自行研制的高值电阻器,构成测试平台,可以对Keithley公司6517B型静电计(20pA~2μA电流量程)进行自动校准。软件采用Visual C++6.0利用校准算法对测量结果进行分析,解决了小电流测量单元校准的计量难题。

关 键 词:+小电流测量单元  参数校准  校准算法

Research on Calibration of Low Current Measurement Unit
XU Ying-chun , MO Wei , LIU Chong , YU Li-hong.Research on Calibration of Low Current Measurement Unit[J].Journal of Astronautic Metrology and Measurement,2012,32(3):35-38.
Authors:XU Ying-chun  MO Wei  LIU Chong  YU Li-hong
Institution:1. Guilin University of Electronic Technology, Guilin 540014 ; 2. China Electronics Standardization Institute, Beijing 100007)
Abstract:Low-current test instruments (such as the electrometer, Pico ammeters, source/measure units, semiconductor precision analyzers, etc. ) play an extremely important role in the electronic and aerospace field and model engineering. The current measurement resolution level of fA grade touched its physical limit. It is a new metrology challenge that the precision low current measurement instruments of high sensitivity and strong resolution are calibrated. Fluke Instrument's 5440B and self-developed NIM- TΩ was used to constitute test platform in this article to calibrate Keithley Instrument's 6517B (current range: 20pA- 2μ A). Visual C + + 6.0 was used to develop calibrating software through analysis of measurement results. The metrology difficult problem of low current measurement unit calibration was solved.
Keywords:+Low Current measurement unit  Parameters calibration  Calibration algorithm
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