Design for testability for future digital avionics systems

The authors describe an integrated testing approach called the Maintenance and Diagnostic System (MADS), which was developed for digital avionics systems using VHSIC and semicustom devices. Mission/operational requirements dictate high availability with capability to detect 98% of all faults and isolate 90% of these faults to a line replacement module (LRM) or 95% of the faults to two LRMs. MADS achieves these goals by defining a module maintenance node (MMN) chip set for each LRM in the system and the design for testability concepts for hardware. The MMN aids parallel, high-speed testing of LRMs, isolating the fault(s) to a module/chip level while incurring less than 10% overhead. It uses the concepts of scan set design, pseudorandom test vector generation, output response compression, and separate scan set loops to test the SSI-MSI logic on the LRM. It also stores interim test results and run-time fault information to isolate the hard-to-reproduce failures and performs verification of interchip and intermodule wiring