单粒子效应及充放电效应诱发航天器故障的甄别与机理探讨

单粒子效应（SEE）是诱发航天器故障最重要的空间环境因素之一，其与充放电效应（SESD）诱发故障的宏观表象相像，但具体影响细节及防护设计又不尽相同，导致工程上将大量可能由SESD诱发的航天器故障简单归零为SEE并进行改进设计，但复飞后的航天器在轨故障依然不断。截至目前，鲜有综合比对研究以揭示这2种效应诱发星用器件错误和导致电子设备故障的异同。文章首先通过大量在轨实例表明二者触发的航天器故障有很强关联，之后对引起2种效应混淆的可能原因进行剖析，并介绍中国科学院国家空间科学中心通过地面模拟实验，针对JK触发器、运算放大器、静态随机存储器（SRAM）初步研究的SEE和SESD诱发软错误的异同表象和作用机制，为进一步发展准确甄别与应对有关在轨故障的技术方法提供参考。

The anomalies supposed to be due to the single event effects may be caused by spacecraft charging induced electrostatic discharge

The single event effects (SEE) is one of the major space environmental factors causing spacecraft anomalies. The anomalies triggered by spacecraft charging induced electrostatic discharge(SESD) and SEE have similar characteristics, but the influence mechanisms and the related countermeasures are not exactly the same, causing many confusions and troubles in spacecraft engineering. As a result, a large number of spacecraft anomalies that may be induced by the SESD are simply attributed to SEE, and the on-orbit anomalies remain in spite of the improved design. Up to now, few comprehensive comparative studies were conducted with respect to the similarities and the differences between the two effects that cause the on-board device errors and lead to failure of electronic equipment. This paper analyzes a large number of in-orbit cases, which show that there is a strong correlation between the spacecraft anomalies triggered by the two effects. Then, the possible reasons for the confusion of the two effects are analyzed, along with the ground simulation experiments conducted by the National Space Science Center of Chinese Academy of Sciences. The similarities and the differences between the soft errors induced by the SEE and the SESD, as well as their influence on the JK flip-flops, the operational amplifiers and the static random access memory (SRAM) are studied, to provide a reference for further development of technical methods to accurately identify and deal with the on-orbit anomalies.