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多弧离子镀Cr/Cr2O3薄膜红外及可见光谱特性
引用本文:向远博%刁训刚%郝雷%顾宝霞.多弧离子镀Cr/Cr2O3薄膜红外及可见光谱特性[J].宇航材料工艺,2008,38(5).
作者姓名:向远博%刁训刚%郝雷%顾宝霞
作者单位:1. 北京航空航天大学理学院,北京,100191
2. 北京有色金属研究总院,北京,100088
摘    要:采用多弧离子镀制备了具有不同色彩的Cr/Cr2O3薄膜,利用紫外-可见光分光光度计研究了薄膜在可见和红外波段的光谱特性,利用SEM进行薄膜表面结构和形貌的分析,利用四探针测阻仪测试了样品的方块电阻,利用红外发射率测量仪测试了样品的红外发射率。结果表明:Cr/Cr2O3薄膜具有丰富的色彩,在可见光区有明显的反射峰,可见光区光谱特性主要受膜厚的影响,方块电阻随膜厚增加而有变大,样品的红外发射率主要取决于金属层,平均红外发射率最小降至0.371。

关 键 词:多弧离子镀  光谱特性  氧化铬  红外发射率

Infrared Optical Spectral Properties of Cr/Cr2O3 Thin Films Prepared by Multi-Arc Ion Deposition
Xiang Yuanbo,Diao Xungang,Hao Lei,Gu Baoxia.Infrared Optical Spectral Properties of Cr/Cr2O3 Thin Films Prepared by Multi-Arc Ion Deposition[J].Aerospace Materials & Technology,2008,38(5).
Authors:Xiang Yuanbo  Diao Xungang  Hao Lei  Gu Baoxia
Abstract:The colorful Cr/Cr2O3 thin films were prepared by Multi-arc ion deposition technique. The visible and infrared optical spectral properties were observed by use of UV-visible spectrophotometer. The surface morphology and structure were studied by scanning electron microscopy (SEM). The square resistance was analyzed by four-probe resistance measuring apparatus. The samples'infrared emissivity was measured by the infrared emissivity measuring instruments. The results show that: Cr/Cr2O3 thin films possess abundant color;obvious reflection peaks are observed in visible wave band;the visible optical spectral properties of the samples are affected mainly by the thickness of the films;the samples'square resistances change with the thickness variety of thin films,samples'infrared emissivity mainly depends on metal layer,the minimum average infrared emissivity is 0.371.
Keywords:Multi-Arc ion deposition  Spectrum properties  Cr2O3  Infrared emissivity
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