| 临近空间大气中子诱发电子器件单粒子翻转数值仿真研究 |
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| 引用本文： | 张振力,蔡明辉,韩建伟,张振龙.临近空间大气中子诱发电子器件单粒子翻转数值仿真研究[J].航天器环境工程,2010,27(4):420-423. |
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| 作者姓名： | 张振力 蔡明辉 韩建伟 张振龙 |
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| 作者单位： | 1. 中国科学院,空间科学与应用研究中心,北京,100190;中国科学院,研究生院,北京,100049
2. 中国科学院,空间科学与应用研究中心,北京,100190 |
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| 基金项目： | 中国科学院科技创新基金 |
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| 摘 要： | 大气中子作为临近空间主要的辐射粒子,能够诱发电子器件发生单粒子翻转效应,严重威胁着临近空间飞行器安全、可靠地工作。文章研究了临近空间大气中子在不同时间、经度、纬度、高度下的能谱,计算了静态存储器(SRAM)中的IMS1601芯片在不同能量各向同性的中子入射下的翻转截面,在国内首次计算出任意两个临近空间位置上飞行器的IMS1601芯片的翻转率,并且对计算结果进行了验证。
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| 关 键 词： | 单粒子翻转 临近空间 中子能谱 翻转截面 翻转率 |
| 收稿时间： | 2009/12/8 0:00:00 |
Numerical simulation of single event upset induced by near space atmospheric neutron in electronic components |
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| Zhang Zhenli,Cai Minghui,Han Jianwei and Zhang Zhenlong.Numerical simulation of single event upset induced by near space atmospheric neutron in electronic components[J].Spacecraft Environment Engineering,2010,27(4):420-423. |
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| Authors: | Zhang Zhenli Cai Minghui Han Jianwei and Zhang Zhenlong |
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| Institution: | Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190, China;
Graduate School, Chinese Academy of Sciences, Beijing 100049, China;Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190, China;;Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190, China;;Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190, China; |
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| Abstract: | Atmospheric neutron is one of the major radioactive particles in the near space which seriously threatens the safety of spacecraft at this region. In this paper, the neutron spectra at different periods, longitudes, latitudes, altitudes are studied. For different energies of isotropic incident neutrons, the upset cross section of the static random access memory (SRAM) is calculated. The single event upset (SEU) rate for SRAM during the flight between any two places in the near space is obtained. All calculation results are verified. |
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| Keywords: | single event upset near space neutron spectra upset cross section single event upset rate |
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