| 航天电子产品加速寿命试验技术研究 |
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| 引用本文： | 冯,颖.航天电子产品加速寿命试验技术研究[J].航天器环境工程,2008,25(6):571-574. |
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| 作者姓名： | 冯 颖 |
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| 作者单位： | 电子工程总体研究所,北京,100854 |
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| 摘 要： | 文章应用加速寿命试验理论和技术,对加速寿命试验的类型、参数模型以及加速方程的线性化等问题进行了分析,针对航天某电子产品的特点以及寿命分布假定,进行了加速寿命试验技术应用的研究,选择了以温度为应力的恒定应力加速寿命试验方案,并给出了应力水平,阐述了基于阿伦尼斯模型的加速寿命试验数据统计分析方法。
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| 关 键 词： | 加速寿命试验 恒定应力 可靠性 电子产品 |
| 收稿时间： | 7/8/2008 12:00:00 AM |
| 修稿时间： | 2008/10/2 0:00:00 |
Accelerated life test technique for some spaceflight electronic products |
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| Feng Ying.Accelerated life test technique for some spaceflight electronic products[J].Spacecraft Environment Engineering,2008,25(6):571-574. |
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| Authors: | Feng Ying |
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| Institution: | Electronic Engineering General Research Institute |
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| Abstract: | The types and parameter models of accelerated life tests along with the linearization of acceleration equations are discussed in conjunction with related theories and techniques. For some spaceflight electronic products,the accelerated life test technology is based on the features of the products along with their age distribution A scheme of the constant stress accelerated life testing taking the temperature as a stress is proposed. The data statistical analysis is based on Arrhenius pattern. |
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| Keywords: | accelerated life test constant stress reliability electronic products |
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