| BP神经网络在元器件贮存可靠性参数预测中的应用 |
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| 引用本文： | 陈海建,胡丽芳,于乐,王焱.BP神经网络在元器件贮存可靠性参数预测中的应用[J].海军航空工程学院学报,2008,23(2):224-226, 233. |
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| 作者姓名： | 陈海建 胡丽芳 于乐 王焱 |
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| 作者单位： | 海军航空工程学院,研究生管理大队,山东,烟台,264001 |
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| 摘 要： | 元器件贮存可靠性受多个非线性因素的影响。时间序列预测实质是实现一个非线性映射。应用BP神经网络模型对某元器件贮存可靠性性能参数时间序列进行了预测,仿真表明BP神经网络预测模型有较高的精度。
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| 关 键 词： | 元器件 贮存可靠性 BP神经网络 预测 |
| 文章编号： | 1673-1522(2008)02-0224-03 |
| 修稿时间： | 2007年8月28日 |
Application of BP Neural Network on the Prediction of Non-operation Reliability of Electron Devices |
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| CHEN Hai-jian,HU Li-fang,YU Le and WANG Yan.Application of BP Neural Network on the Prediction of Non-operation Reliability of Electron Devices[J].Journal of Naval Aeronautical Engineering Institute,2008,23(2):224-226, 233. |
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| Authors: | CHEN Hai-jian HU Li-fang YU Le and WANG Yan |
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| Institution: | (Graduate Students＇ Brigade ofNAAU, Yantai Shandong 264001, China) |
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| Abstract: | The storage reliability of electron devices is affected by several nonlinear factors. The time series prediction is essentially to realize a nonlinear mapping from the input space to the out space. A BP neural network model for the prediction of the storage reliability of electron devices was introduced. It was shown that the BP neural network model was an accurate and practical method. |
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| Keywords: | electron devices the storage reliability BP neural network prediction |
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