K6R4016V1D芯片在低地球轨道发生单粒子效应频次的分析

俄罗斯福布斯-土壤火星探测器于2011年11月9日携带中国首个火星探测器萤火一号进入低地球轨道(LEO),但原定于159min后探测器在轨发动机点火变轨未能实施,最终探测计划失败.俄罗斯航天局研究分析认为,事故最可能是由于宇宙线重离子轰击星载计算机存储器件,导致两台计算机重启所致.但是抗辐射专家对空间辐射粒子会在如此短时间内通过单粒子效应(SEE)导致LEO探测器失效的观点并不认同.本文根据俄罗斯航天局发布的受影响器件信息,通过实验和计算,分析了K6R4016V1D芯片在低地球轨道运行时可能遇到的空间辐射粒子诱发单粒子效应的频次,探讨了单粒子效应导致福布斯-土壤火星探测器失效的可能性.

Analysis of Single-event Effects Rate of K6R4016V1D Chips Applied in Low Earth Orbit

Russia's Mars probe Phobos-Grunt together with China's first Mars probe Yinghuo-1 were launched into Low Earth Orbit (LEO) on November 9, 2011. Unfortunately, the main probe failed to fire its thrusters and transfer its orbit as planned after 159 minutes, eventually the trip to Mars was terminated. The most likely cause of the accident investigated by Russian Space Agency (RSA) was that RAM chips in onboard control computers worked wrong when hit by cosmic heavy charged particles, which sequently led to the two computers restart and eventually disturbed the probe totally. However experts on satellite radiation hardness casted lot of doubt on the statement that LEO probe can be effected by Single-Event Effects (SEE) resulting from space radiation particles in so short period of time. Based on information of the victim RAM components disclosed by RSA, experiment tests and calculations were performed for K6R4016V1D chip to predict SEE rate when applied in LEO. Finally, possibility for SEE to cause the failure of Phobos-Grunt probe was discussed.