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星载设备抗单粒子效应的设计技术初探
引用本文:王长龙,沈石岑,张传军.星载设备抗单粒子效应的设计技术初探[J].航天控制,1995(3).
作者姓名:王长龙  沈石岑  张传军
作者单位:北京控制工程研究所
摘    要:本文探讨了现代星载设备研制过程中遇到的抗辐射设计问题之一,即抗单粒子效应的设计问题,首先简单介绍高能粒子引起的单粒子效应──单粒子翻转(SEU)和单粒子锁定(SEL),在此基础上分别探讨了星载设备抗SEL和抗SEU的设计方法。

关 键 词:星载计算机,抗辐射加固,技术

Design Method of On-Board Equipment Tolerance of Single Event Phenomena
Wang Changlong,Shen Shicen,Zhang Chuanjun.Design Method of On-Board Equipment Tolerance of Single Event Phenomena[J].Aerospace Control,1995(3).
Authors:Wang Changlong  Shen Shicen  Zhang Chuanjun
Institution:Beijing Institute of Control Engineering 100080
Abstract:In this paper,a radiation-tolerant design method for single event phenomena(SEP), which should be considered in the development of modern on-board equipment,is discussed.An introduction of SEP covering single event upset(SEU)and single event latch-up(SEP)induced by high evergetic particle is given,and then the design method of on-board equipment to tolerate SEP is presented.
Keywords:Satellite-borne computer  Radiation hardening  Technique  
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