| 基于MC/DC最小测试用例集设计方法研究 |
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| 引用本文： | 袁军.基于MC/DC最小测试用例集设计方法研究[J].航空电子技术,2010,41(3):51-54. |
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| 作者姓名： | 袁军 |
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| 作者单位： | 南京航空航天大学,南京,210016;中国航空无线电电子研究所,上海,200233 |
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| 摘 要： | 动态测试主要是通过设计测试用例、开发和运行测试程序来发现软件中存在的错误。如何判断设计的测试用例是充分的,针对不同级别的软件,DO-178B规定了不同的结构覆盖标准。本文针对A级软件,给出一种适合MC/DC准则的最小测试用例集快速设计方法。针对一个判定中同一条件出现多次的复杂情形引起的两种不同用例设计思路,结合LDRATestbed覆盖分析结果,总结出合理的设计方法。
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| 关 键 词： | DO-178B 改进条件／判定范围（MC／DC） 最小测试用例集 |
Research on Method for Designing Minimal Test Cases Set Based on MC/DC |
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| YUAN Jun.Research on Method for Designing Minimal Test Cases Set Based on MC/DC[J].Avionics Technology,2010,41(3):51-54. |
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| Authors: | YUAN Jun |
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| Institution: | YUAN Jun (1. Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China; 2. China National Aeronautical Radio Electronics Research Institute, Shanghai 200233, China) |
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| Abstract: | Dynamic tests find errors which exist in the software through designing test cases, developing and running test procedures. How to determine the design of test cases is sufficient, DO-178B provides the different criteria of structure coverage for different levels of sottware. Aiming at Level A software, this paper shows a fast design method to generate minimal test cases set based on MC/DC criterion. There are two different case design ideas for a complicated situation, in which a one condition appears more than once in a decision. A reasonable design will be is concluded for this situation combined with the coverage analysis result by LDRA testbed. |
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| Keywords: | DO-178B |
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